Results for “defect-detection”

Trains, evaluates, exports, and runs inference for Siamese-network-based optical inspection models to detect manufacturing defects and quality issues in image pairs.

Investigates hard, flaky, or performance failures through a six-phase feedback-loop-first debugging process; use when quick targeted debugging is insufficient.

Reproduce a bug as a failing regression test, fix until green, review, and commit via a delegated pipeline.

Debugging specialist for errors, test failures, and unexpected behavior. Use proactively when encountering any issues.

Find the earliest decisive failure in an agent run trace and propose an evidence-backed targeted repair. Load when a run failed, results are wrong, or the user asks what went wrong in an agent session. Also triggers on "localize the fault", "first incorrect step", "debug this run", "trace attribution", "why did the agent fail", or after run-trace captures errors. Pairs with debug-and-fix for code defects and dynamic-routing for plan faults.

Use when encountering any bug, test failure, or unexpected behavior, before proposing fixes

Systematic debugging workflow for errors and bugs. Use when debugging errors, investigating bugs, troubleshooting issues, or when something isn't working as expected. Integrates Sentry MCP for production error context, Firecrawl for researching fix patterns, and Sequential Thinking for complex multi-step diagnosis.

Composite skill — full debugging workflow from "this is broken" to root cause and fix. Chains systematic-debugging (root-cause hypotheses) → tracer agent (evidence walk) → sentry (production correlation if applicable) → ci-watch (regression check) → incident-response (if production-impacting). Use when a bug needs deep investigation, not just a quick fix.

Automates the full DEFT AOI improvement loop for NVIDIA TAO VisualChangeNet / ChangeNet PCB inspection models, including baseline evaluation, RCA, synthetic defect generation, data mining, retraining, and deployment gating until KPI targets are met.