a5c-ai AFM-SPM Analyzer
Purpose
The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.
Capabilities
- Topography imaging and analysis
- Surface roughness calculation (Ra, RMS)
- Force-distance curve analysis
- Nanoindentation and mechanical mapping
- Kelvin probe force microscopy (KPFM)
- Conductive AFM measurements
Usage Guidelines
AFM Analysis Workflow
Topography Analysis
- Apply plane leveling corrections
- Remove artifacts and noise
- Calculate roughness parameters
Mechanical Mapping
- Calibrate cantilever spring constant
- Apply contact mechanics models
- Generate modulus maps
Electrical Measurements
- Calibrate work function reference
- Map surface potential
- Measure local conductivity
Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- In-Situ Characterization Experiment Design
- Thin Film Deposition Process Optimization
Input Schema
{
"data_file": "string",
"analysis_type": "topography|force_curves|mechanical|electrical",
"cantilever_specs": {
"spring_constant": "number (N/m)",
"tip_radius": "number (nm)"
}
}
Output Schema
{
"topography": {
"Ra": "number (nm)",
"RMS": "number (nm)",
"Rmax": "number (nm)",
"image_path": "string"
},
"mechanical": {
"modulus": "number (GPa)",
"adhesion": "number (nN)",
"deformation": "number (nm)"
},
"electrical": {
"surface_potential": "number (mV)",
"work_function": "number (eV)"
}
}