Reliability Growth Analysis

Use when you must determine whether a system failure rate is improving over development or field test time: fit the Duane growth slope by ordinary least squares of the log cumulative failure rate on log cumulative time, fit the Crow-AMSAA power-law process shape beta by deterministic MLE bisection, and read the growth verdict off the fitted shape against the 1.0 boundary. Produces the duane-growth-slope, the amsaa-shape-beta with the lambda scale, the fitted current-mtbf under both estimators, the projected-mtbf at a target cumulative test time, and the improving, hpp-constant or degrading verdict that decides whether continued testing or a corrective redesign is warranted. Trigger: reliability growth analysis, duane-growth-slope, amsaa-shape-beta, growth-verdict, test-time-projection, fitted current-mtbf, power-law process, cumulative test time.

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